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2023

conference Metamorphic Testing of an Automated Parking System: An Experience Report. COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference, 2023. [DOI] [Cite]

Cite: Metamorphic Testing of an Automated Parking System: An Experience Report ×

ACM APA Chicago CSE IEEE BibTeX

Dave Towey, Zepei Luo, Ziqi Zheng, Peijian Zhou, Junbo Yang, Puttipatt Ingkasit, Changyang Lao, Matthew Pike, Yifan Zhang. 2023. Metamorphic Testing of an Automated Parking System: An Experience Report. In COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference. DOI:https://doi.org/10.1109/COMPSAC57700.2023.00274

Dave Towey and Zepei Luo and Ziqi Zheng and Peijian Zhou and Junbo Yang and Puttipatt Ingkasit and Changyang Lao and Matthew Pike and Yifan Zhang. (2023). Metamorphic Testing of an Automated Parking System: An Experience Report. COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference. https://doi.org/10.1109/COMPSAC57700.2023.00274

Dave Towey and Zepei Luo and Ziqi Zheng and Peijian Zhou and Junbo Yang and Puttipatt Ingkasit and Changyang Lao and Matthew Pike and Yifan Zhang. "Metamorphic Testing of an Automated Parking System: An Experience Report." COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference, 2023. https://doi.org/10.1109/COMPSAC57700.2023.00274

Dave Towey, Zepei Luo, Ziqi Zheng, Peijian Zhou, Junbo Yang, Puttipatt Ingkasit, Changyang Lao, Matthew Pike, Yifan Zhang. 2023. Metamorphic Testing of an Automated Parking System: An Experience Report. COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference. doi:10.1109/COMPSAC57700.2023.00274

Dave Towey and Zepei Luo and Ziqi Zheng and Peijian Zhou and Junbo Yang and Puttipatt Ingkasit and Changyang Lao and Matthew Pike and Yifan Zhang, "Metamorphic Testing of an Automated Parking System: An Experience Report," COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference, 2023. doi: 10.1109/COMPSAC57700.2023.00274

@inproceedings{compsac-2023-2,
  title={Metamorphic Testing of an Automated Parking System: An Experience Report},
  author={Dave Towey and Zepei Luo and Ziqi Zheng and Peijian Zhou and Junbo Yang and Puttipatt Ingkasit and Changyang Lao and Matthew Pike and Yifan Zhang},
  booktitle={COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference},
  year={2023},
  doi={10.1109/COMPSAC57700.2023.00274}
}

conference Automated Metamorphic-Relation Generation with ChatGPT: An Experience Report. COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference, 2023. [DOI] [Cite]

Cite: Automated Metamorphic-Relation Generation with ChatGPT: An Experience Report ×

ACM APA Chicago CSE IEEE BibTeX

Yifan Zhang, Dave Towey, Matthew Pike. 2023. Automated Metamorphic-Relation Generation with ChatGPT: An Experience Report. In COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference. DOI:https://doi.org/10.1109/COMPSAC57700.2023.00275

Yifan Zhang and Dave Towey and Matthew Pike. (2023). Automated Metamorphic-Relation Generation with ChatGPT: An Experience Report. COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference. https://doi.org/10.1109/COMPSAC57700.2023.00275

Yifan Zhang and Dave Towey and Matthew Pike. "Automated Metamorphic-Relation Generation with ChatGPT: An Experience Report." COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference, 2023. https://doi.org/10.1109/COMPSAC57700.2023.00275

Yifan Zhang, Dave Towey, Matthew Pike. 2023. Automated Metamorphic-Relation Generation with ChatGPT: An Experience Report. COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference. doi:10.1109/COMPSAC57700.2023.00275

Yifan Zhang and Dave Towey and Matthew Pike, "Automated Metamorphic-Relation Generation with ChatGPT: An Experience Report," COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference, 2023. doi: 10.1109/COMPSAC57700.2023.00275

@inproceedings{compsac-2023-1,
  title={Automated Metamorphic-Relation Generation with ChatGPT: An Experience Report},
  author={Yifan Zhang and Dave Towey and Matthew Pike},
  booktitle={COMPSAC 2023 - 47th Annual Computers, Software, and Applications Conference},
  year={2023},
  doi={10.1109/COMPSAC57700.2023.00275}
}

book-chapter Applying Software-Engineering Thinking to Teaching in EMI Sino-Foreign Higher Education. Multilingual Education Yearbook 2023, 2023. [DOI] [Cite]

Cite: Applying Software-Engineering Thinking to Teaching in EMI Sino-Foreign Higher Education ×

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Matthew Pike, Boon-Giin Lee, Dave Towey. 2023. Applying Software-Engineering Thinking to Teaching in EMI Sino-Foreign Higher Education. In Multilingual Education Yearbook 2023. DOI:https://doi.org/10.1007/978-3-031-32811-4_9

Matthew Pike and Boon-Giin Lee and Dave Towey. (2023). Applying Software-Engineering Thinking to Teaching in EMI Sino-Foreign Higher Education. Multilingual Education Yearbook 2023. https://doi.org/10.1007/978-3-031-32811-4_9

Matthew Pike and Boon-Giin Lee and Dave Towey. "Applying Software-Engineering Thinking to Teaching in EMI Sino-Foreign Higher Education." Multilingual Education Yearbook 2023, 2023. https://doi.org/10.1007/978-3-031-32811-4_9

Matthew Pike, Boon-Giin Lee, Dave Towey. 2023. Applying Software-Engineering Thinking to Teaching in EMI Sino-Foreign Higher Education. Multilingual Education Yearbook 2023. doi:10.1007/978-3-031-32811-4_9

Matthew Pike and Boon-Giin Lee and Dave Towey, "Applying Software-Engineering Thinking to Teaching in EMI Sino-Foreign Higher Education," Multilingual Education Yearbook 2023, 2023. doi: 10.1007/978-3-031-32811-4_9

@incollection{springer-yearbook-2023,
  title={Applying Software-Engineering Thinking to Teaching in EMI Sino-Foreign Higher Education},
  author={Matthew Pike and Boon-Giin Lee and Dave Towey},
  booktitle={Multilingual Education Yearbook 2023},
  year={2023},
  doi={10.1007/978-3-031-32811-4_9}
}

conference Metamorphic Testing Harness for the Baidu Apollo Perception-Camera Module. 2023 IEEE/ACM 8th International Workshop on Metamorphic Testing (MET), 2023. [DOI] [Cite]

Cite: Metamorphic Testing Harness for the Baidu Apollo Perception-Camera Module ×

ACM APA Chicago CSE IEEE BibTeX

Yifan Zhang, Dave Towey, Matthew Pike, Jia Cheng Han, George Zhou, Chenghao Yin, Qian Wang, Chen Xie. 2023. Metamorphic Testing Harness for the Baidu Apollo Perception-Camera Module. In 2023 IEEE/ACM 8th International Workshop on Metamorphic Testing (MET). DOI:https://doi.org/10.1109/MET59151.2023.00009

Yifan Zhang and Dave Towey and Matthew Pike and Jia Cheng Han and George Zhou and Chenghao Yin and Qian Wang and Chen Xie. (2023). Metamorphic Testing Harness for the Baidu Apollo Perception-Camera Module. 2023 IEEE/ACM 8th International Workshop on Metamorphic Testing (MET). https://doi.org/10.1109/MET59151.2023.00009

Yifan Zhang and Dave Towey and Matthew Pike and Jia Cheng Han and George Zhou and Chenghao Yin and Qian Wang and Chen Xie. "Metamorphic Testing Harness for the Baidu Apollo Perception-Camera Module." 2023 IEEE/ACM 8th International Workshop on Metamorphic Testing (MET), 2023. https://doi.org/10.1109/MET59151.2023.00009

Yifan Zhang, Dave Towey, Matthew Pike, Jia Cheng Han, George Zhou, Chenghao Yin, Qian Wang, Chen Xie. 2023. Metamorphic Testing Harness for the Baidu Apollo Perception-Camera Module. 2023 IEEE/ACM 8th International Workshop on Metamorphic Testing (MET). doi:10.1109/MET59151.2023.00009

Yifan Zhang and Dave Towey and Matthew Pike and Jia Cheng Han and George Zhou and Chenghao Yin and Qian Wang and Chen Xie, "Metamorphic Testing Harness for the Baidu Apollo Perception-Camera Module," 2023 IEEE/ACM 8th International Workshop on Metamorphic Testing (MET), 2023. doi: 10.1109/MET59151.2023.00009

@inproceedings{met-2023,
  title={Metamorphic Testing Harness for the Baidu Apollo Perception-Camera Module},
  author={Yifan Zhang and Dave Towey and Matthew Pike and Jia Cheng Han and George Zhou and Chenghao Yin and Qian Wang and Chen Xie},
  booktitle={2023 IEEE/ACM 8th International Workshop on Metamorphic Testing (MET)},
  year={2023},
  doi={10.1109/MET59151.2023.00009}
}

journal Pre-Impact Firefighter Fall Detection Using Machine Learning on the Edge. IEEE Sensors Journal, 2023. [DOI] [Cite]

Cite: Pre-Impact Firefighter Fall Detection Using Machine Learning on the Edge ×

ACM APA Chicago CSE IEEE BibTeX

Xiaoqing Chai, Boon-Giin Lee, Matthew Pike, Renjie Wu, David Chieng, Wan-Young Chung. 2023. Pre-Impact Firefighter Fall Detection Using Machine Learning on the Edge. In IEEE Sensors Journal. DOI:https://doi.org/10.1109/JSEN.2023.3279858

Xiaoqing Chai and Boon-Giin Lee and Matthew Pike and Renjie Wu and David Chieng and Wan-Young Chung. (2023). Pre-Impact Firefighter Fall Detection Using Machine Learning on the Edge. IEEE Sensors Journal. https://doi.org/10.1109/JSEN.2023.3279858

Xiaoqing Chai and Boon-Giin Lee and Matthew Pike and Renjie Wu and David Chieng and Wan-Young Chung. "Pre-Impact Firefighter Fall Detection Using Machine Learning on the Edge." IEEE Sensors Journal, 2023. https://doi.org/10.1109/JSEN.2023.3279858

Xiaoqing Chai, Boon-Giin Lee, Matthew Pike, Renjie Wu, David Chieng, Wan-Young Chung. 2023. Pre-Impact Firefighter Fall Detection Using Machine Learning on the Edge. IEEE Sensors Journal. doi:10.1109/JSEN.2023.3279858

Xiaoqing Chai and Boon-Giin Lee and Matthew Pike and Renjie Wu and David Chieng and Wan-Young Chung, "Pre-Impact Firefighter Fall Detection Using Machine Learning on the Edge," IEEE Sensors Journal, 2023. doi: 10.1109/JSEN.2023.3279858

@article{ieee-sensors-2023-2,
  title={Pre-Impact Firefighter Fall Detection Using Machine Learning on the Edge},
  author={Xiaoqing Chai and Boon-Giin Lee and Matthew Pike and Renjie Wu and David Chieng and Wan-Young Chung},
  journal={IEEE Sensors Journal},
  year={2023},
  doi={10.1109/JSEN.2023.3279858}
}

conference A Novel Attitude Feature Extraction Method for Multi-IMU Based Fall Detection System. 2023 IEEE 3rd International Conference on Power, Electronics and Computer Applications (ICPECA), 2023. [DOI] [Cite]

Cite: A Novel Attitude Feature Extraction Method for Multi-IMU Based Fall Detection System ×

ACM APA Chicago CSE IEEE BibTeX

Xiaoqing Chai, Boon-Giin Lee, Matthew Pike, Renjie Wu, Xian Wu. 2023. A Novel Attitude Feature Extraction Method for Multi-IMU Based Fall Detection System. In 2023 IEEE 3rd International Conference on Power, Electronics and Computer Applications (ICPECA). DOI:https://doi.org/10.1109/ICPECA56706.2023.10075997

Xiaoqing Chai and Boon-Giin Lee and Matthew Pike and Renjie Wu and Xian Wu. (2023). A Novel Attitude Feature Extraction Method for Multi-IMU Based Fall Detection System. 2023 IEEE 3rd International Conference on Power, Electronics and Computer Applications (ICPECA). https://doi.org/10.1109/ICPECA56706.2023.10075997

Xiaoqing Chai and Boon-Giin Lee and Matthew Pike and Renjie Wu and Xian Wu. "A Novel Attitude Feature Extraction Method for Multi-IMU Based Fall Detection System." 2023 IEEE 3rd International Conference on Power, Electronics and Computer Applications (ICPECA), 2023. https://doi.org/10.1109/ICPECA56706.2023.10075997

Xiaoqing Chai, Boon-Giin Lee, Matthew Pike, Renjie Wu, Xian Wu. 2023. A Novel Attitude Feature Extraction Method for Multi-IMU Based Fall Detection System. 2023 IEEE 3rd International Conference on Power, Electronics and Computer Applications (ICPECA). doi:10.1109/ICPECA56706.2023.10075997

Xiaoqing Chai and Boon-Giin Lee and Matthew Pike and Renjie Wu and Xian Wu, "A Novel Attitude Feature Extraction Method for Multi-IMU Based Fall Detection System," 2023 IEEE 3rd International Conference on Power, Electronics and Computer Applications (ICPECA), 2023. doi: 10.1109/ICPECA56706.2023.10075997

@inproceedings{icpeca-2023,
  title={A Novel Attitude Feature Extraction Method for Multi-IMU Based Fall Detection System},
  author={Xiaoqing Chai and Boon-Giin Lee and Matthew Pike and Renjie Wu and Xian Wu},
  booktitle={2023 IEEE 3rd International Conference on Power, Electronics and Computer Applications (ICPECA)},
  year={2023},
  doi={10.1109/ICPECA56706.2023.10075997}
}

2022

book-chapter Evaluating Microlearning: A Cross-faculty Case Study of a Sino-foreign University. Agile Learning Environments amid Disruption, 2022. [DOI] [Cite]

Cite: Evaluating Microlearning: A Cross-faculty Case Study of a Sino-foreign University ×

ACM APA Chicago CSE IEEE BibTeX

David Krygier, Lauren Ruth Knowles, Amarpreet Gill, Chiew-Foong Kwong, Derek Irwin, Dave Towey, Matthew Pike. 2022. Evaluating Microlearning: A Cross-faculty Case Study of a Sino-foreign University. In Agile Learning Environments amid Disruption. DOI:https://doi.org/10.1007/978-3-030-92979-4_4

David Krygier and Lauren Ruth Knowles and Amarpreet Gill and Chiew-Foong Kwong and Derek Irwin and Dave Towey and Matthew Pike. (2022). Evaluating Microlearning: A Cross-faculty Case Study of a Sino-foreign University. Agile Learning Environments amid Disruption. https://doi.org/10.1007/978-3-030-92979-4_4

David Krygier and Lauren Ruth Knowles and Amarpreet Gill and Chiew-Foong Kwong and Derek Irwin and Dave Towey and Matthew Pike. "Evaluating Microlearning: A Cross-faculty Case Study of a Sino-foreign University." Agile Learning Environments amid Disruption, 2022. https://doi.org/10.1007/978-3-030-92979-4_4

David Krygier, Lauren Ruth Knowles, Amarpreet Gill, Chiew-Foong Kwong, Derek Irwin, Dave Towey, Matthew Pike. 2022. Evaluating Microlearning: A Cross-faculty Case Study of a Sino-foreign University. Agile Learning Environments amid Disruption. doi:10.1007/978-3-030-92979-4_4

David Krygier and Lauren Ruth Knowles and Amarpreet Gill and Chiew-Foong Kwong and Derek Irwin and Dave Towey and Matthew Pike, "Evaluating Microlearning: A Cross-faculty Case Study of a Sino-foreign University," Agile Learning Environments amid Disruption, 2022. doi: 10.1007/978-3-030-92979-4_4

@incollection{palgrave-macmillan-2022,
  title={Evaluating Microlearning: A Cross-faculty Case Study of a Sino-foreign University},
  author={David Krygier and Lauren Ruth Knowles and Amarpreet Gill and Chiew-Foong Kwong and Derek Irwin and Dave Towey and Matthew Pike},
  booktitle={Agile Learning Environments amid Disruption},
  year={2022},
  doi={10.1007/978-3-030-92979-4_4}
}

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